1998 / Solid Freeform Fabrication Proceedings
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Author Mark D. Van Roosendaal, Peter Chamberlain, Charles L. Thomas, University of Utah
Source Solid Freeform Fabrication Proceedings, 1998, pp 435-442
Abstract In this paper, we introduce two-dimensional discrete wavelet basis functions and their application in the analysis and modeling of surface topography in layered manufacturing objects. In previous work, a one dimensional wavelet transform technique was developed to generate variable thickness layers. For vertical edge layers Haar wavelet decomposition is used in the slicing direction but is not useful in the slicing plane. For frequency analysis within the slicing plane, bi-orthogonal wavelets provide the desired analysis ability. When analyzing layered manufacturing with ruled edges a true 2-D transform is appropriate. Two-dimensional wavelet analysis simultaneously controls the layer thickness as well as the density of control points required in the surface definition of each layer edge. (Auth abstract) [References: 6]
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