2003 / Solid Freeform Fabrication Proceedings
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Author Benay Sager, David W. Rosen, Meghan Shilling and Thomas R. Kurfess The Woodruff School of Mechanical Engineering Georgia Institute of Technology Atlanta, GA 30332-0405
Source Solid Freeform Fabrication Proceedings, 2003, pp 70-81.
Abstract As we move towards micron-scale rapid manufacturing, it is critical to understand build resolution of Stereolithography technology. In order to determine the resolution limitations, positive and negative features on Stereolithography parts were built and analyzed. Results from several experiments were compared to an analytical model and important resolution issues are highlighted. Based on these experimental results, parameters that will maximize build resolution for a number of well-understood shapes are suggested in the paper. Build resolution experimental results, analysis, and measurement techniques are discussed. Conclusions are drawn related to feature shape as resolution limits are approached. (Auth abstract) [References: 8] XX
Solid Freeform Fabrication Proceedings can be obtained from: The Solid Freeform Fabrication Symposium
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