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Author Han, Wenbiao. Jafari, Mohsen A. Institution Rutgers Univ, Piscataway, NJ, USA
Source Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. v 3 2000. IEEE, Piscataway, NJ, USA,00CB37166. p 1709-1714.
Abstract To build high quality functional parts in layered manufacturing process, it is imperative to achieve deposition accuracy. To this end, we propose a real time coordination controller and a tool path based deposition planning scheme respectively. This paper presents the motivations and ideas of these two approaches and makes a comparison. (Auth abstract) [References: 11] XX