Home prods links sb's patents Publ cont

Use the browser's BACK button to return to the SEARCH RESULTS pages.

2001 (and backfills for previous years) / DB reference years
PREV and NEXT link to numerically adjacent references for this DATABASE UPDATE.
CONTENTS links to the title list for this UPDATE's references.

Prev | Next | Contents


44. Coordination control and deposition planning for improving deposition accuracy in layered manufacturing process

Author Han, Wenbiao. Jafari, Mohsen A. Institution Rutgers Univ, Piscataway, NJ, USA

Source Proceedings of the IEEE International Conference on Systems, Man and Cybernetics. v 3 2000. IEEE, Piscataway, NJ, USA,00CB37166. p 1709-1714.

Abstract To build high quality functional parts in layered manufacturing process, it is imperative to achieve deposition accuracy. To this end, we propose a real time coordination controller and a tool path based deposition planning scheme respectively. This paper presents the motivations and ideas of these two approaches and makes a comparison. (Auth abstract) [References: 11] XX




Prev | Next | Contents

Home prods links sb's patents Publ cont

(C) Copyright Castle Island Co., All Rights Reserved.
REV 0 - - - 7/27/01