Home prods links sb's patents Publ cont

Use the browser's BACK button to return to the SEARCH RESULTS pages.

1998 / DB reference year
PREV and NEXT link to numerically adjacent references for this YEAR.
CONTENTS links to the title list for this YEAR's references.

Prev | Next | Contents


19. Defect detection in indirect layered manufacturing

Author Bakhadyrov, Izzat. Jafari, Mohsen A. Fang, Tong. Safari, Ahmad. Danforth, Stephen. Langrana, Noshir. Institution Rutgers Univ, Piscataway, NJ, USA

Source Proceedings of the IEEE International Conference on Systems, Man and Cybernetics 5 1998. IEEE, Piscataway, NJ, USA,98CB36218.. p 4251-4254. Proceedings of the 1998 IEEE International Conference on Systems, Man, and Cybernetics. Part 5 (of 5). San Diego, CA, USA. 19981011-19981014.

Abstract Direct Layered Manufacturing (LM) is an additive manufacturing process where part is built layer by layer based on its CAD file. Indirect LM is a process where mold for a part is built by direct LM process. In this work we demonstrate a machine vision setup for surface voids detection which can be used for surface quality inspection of parts built by indirect LM and certain direct LM techniques. (Auth abstract) [References: 8] XX



Prev | Next | Contents

Home prods links sb's patents Publ cont

(C) Copyright Castle Island Co., All Rights Reserved.
REV 0 - - - 5/1/00