1998 / DB reference year
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Author Fang, Tong. Jafari, Mohsen A. Bakhadyrov, Izzat. Safari, Ahmad. Danforth, Stephen. Langrana, Noshir. Institution Rutgers Univ, Piscataway, NJ, USA
Source Proceedings of the IEEE International Conference on Systems, Man and Cybernetics 5 1998. IEEE, Piscataway, NJ, USA,98CB36218.. p 4373-4378. Proceedings of the 1998 IEEE International Conference on Systems, Man, and Cybernetics. Part 5 (of 5). San Diego, CA, USA. 19981011-19981014.
Abstract This paper presents the concept of process signature for the use of on-line defect detection in Layered Manufacturing. To achieve the high quality of parts built by the Fused Deposition of Ceramics (FDC), an on-line monitoring system is implemented to detect the processing defects. Using the process signature extracted from the original image captured by the monitoring system, an expected image is created which is then compared to the original image to detect and identify the defects. (Auth abstract) [References: 7] XX